zzzzzzzzzz2
New Member
- Joined
- Aug 14, 2016
Background:
Up until recently, CPU or System-on-Chip (SoC) devices I have stress-tested and that have newly been installed or Thermal Interface Material (TIM) newly applied, have not throttled their performance. In these cases, the cooling system was good enough and the stress procedure was simple: Run a thread in each core for a prolonged period of time (I often used 48 hours), then let cool. The processor would then be effectively broken in to work consistently, and the Thermal Interface Material should have become well distributed.
Especially in modern times, I have come across cooling solutions that are inadequate to cool the newly installed or TIM-ed CPU or SoCs, and are still to be used with the CPUs or SoCs in a final product. Good examples of this are computers with small form factors (oftentimes having a non-standard case), smartphones, and similar electronics.
The Problem:
Newly installed or TIM-ed CPUs and SoCs that have inadequate cooling solutions exhibit behaviors during stress tests that do not manifest when the cooling solutions are adequate. For these devices, one typically observes throttling of performance and sustained high temperatures. As the TIM flows, cures, or sets, the throttling decreases and temperatures might decrease or stay the same.
The Considerations:
It is important to consider how to go about initially stress-testing CPUs or SoCs that have inadequate cooling solutions (and consequently thermal throttle performance) so that they be well exerted to the maximum of their intended performance, and so that their TIM flows, cures, or sets well and properly. If one allows the CPU/SoC to run at maximum, performance throttling occurs and the CPU/SoC cannot run for a prolonged period of time at maximum exertion. I am also uncertain how much the thermal throttling affects the TIM's ability to flow, cure, or set correctly.
The Questions:
What is the best way to go about stress testing under the problem condition described herein?
My impression is that, to be able to account for the various considerations of the problem, one should perform initial stress-testing in one continuous run where the performance is at first intentionally restricted (to avoid thermal throttling's instability), then eventually allow performance to rise in steps until maximum. I would think that this method would best minimize any problems, while also most closely achieving the desired outcome.
What do you guys think? Questions and Comments are welcome.
Up until recently, CPU or System-on-Chip (SoC) devices I have stress-tested and that have newly been installed or Thermal Interface Material (TIM) newly applied, have not throttled their performance. In these cases, the cooling system was good enough and the stress procedure was simple: Run a thread in each core for a prolonged period of time (I often used 48 hours), then let cool. The processor would then be effectively broken in to work consistently, and the Thermal Interface Material should have become well distributed.
Especially in modern times, I have come across cooling solutions that are inadequate to cool the newly installed or TIM-ed CPU or SoCs, and are still to be used with the CPUs or SoCs in a final product. Good examples of this are computers with small form factors (oftentimes having a non-standard case), smartphones, and similar electronics.
The Problem:
Newly installed or TIM-ed CPUs and SoCs that have inadequate cooling solutions exhibit behaviors during stress tests that do not manifest when the cooling solutions are adequate. For these devices, one typically observes throttling of performance and sustained high temperatures. As the TIM flows, cures, or sets, the throttling decreases and temperatures might decrease or stay the same.
The Considerations:
It is important to consider how to go about initially stress-testing CPUs or SoCs that have inadequate cooling solutions (and consequently thermal throttle performance) so that they be well exerted to the maximum of their intended performance, and so that their TIM flows, cures, or sets well and properly. If one allows the CPU/SoC to run at maximum, performance throttling occurs and the CPU/SoC cannot run for a prolonged period of time at maximum exertion. I am also uncertain how much the thermal throttling affects the TIM's ability to flow, cure, or set correctly.
The Questions:
What is the best way to go about stress testing under the problem condition described herein?
My impression is that, to be able to account for the various considerations of the problem, one should perform initial stress-testing in one continuous run where the performance is at first intentionally restricted (to avoid thermal throttling's instability), then eventually allow performance to rise in steps until maximum. I would think that this method would best minimize any problems, while also most closely achieving the desired outcome.
What do you guys think? Questions and Comments are welcome.