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hitechjb1 said:...
2. Electronic component level:
- N-type FETs (field effect transistor)
- P-type FETs
- diodes
- capacitors
- small amount of resistors, …
Typically of the order of tens of millions transistors, few 100 millions capacitors, ~ 100 millions wire segments, ...
E.g. Palomino has 37.5 million, Tbred A and B have 37.2 and 37.6 millions respectively.
Intersection of polysilicon and diffusion forms a transistor.
Typically, for 0.13 micron (or 130 nm) technology (Tbred B/Barton)
- length of transistor = 130 nm
- width of transistor = 1 to 10 times of length, up to few 100 times
- gate oxide thickness 2 - 3 nm
(1 nm = 1/1000000000 meter)
...
MRip said:Anybody know how the incredibly precise manufacturing process can vary enough to produce chips with max frequencies hundreds of mhz apart when each chip should theoretically be identical?
MRip said:Anybody know how the incredibly precise manufacturing process can vary enough to produce chips with max frequencies hundreds of mhz apart when each chip should theoretically be identical?
hitechjb1 said:Lower voltage, shorter transistor channel length, lower transistor threshold voltage and Tbred B 1700+/1800+DLT3C
The Tbred B 1700+ can perform so well in general, as reported by so many people, such coincidence is not just by luck. I think it has something to do with its intrinsic transistor properties, resembling some future trends for silicon scaling into future generations, namely, lower voltage, shorter transistor channel length, faster transistors for the good, but higher leakage current for the bad.
There are process variations of a given silicon manufacturing process, as in any manufacturing process. As a result, the intrsinic silicon proporties, such as transistor channel length and width, gate oxide thickness, silicon carrier doping, transistor threshold voltage, leakage current, random manufacturing defects, ..., of a chip in a silicon wafer can vary to certain extent (sigma variation). As further scaling down, statistical variation comes into play, i.e. nearby transistors with the same design attribute in the same chip/wafer can even behave differently.
A more interesting question is what the implications of these wafer properties of lower threshold voltage and shorter channel length due to process variation of a manufacturing process are, as I suspect for the the Tbred B DLT3C. It is being rated at lower Vcore but it can run faster than other Tbred B at same voltage. Even it is manufactured with 0.13 micron like other Tbred B, it is effectively behaving like a chip with less than 0.13 micron, resembling the future generation trend.
As the transistor size (channel length) of future generations of silicon chips are scaled down to, e.g., 90, 65, 45, ... nano-meter (nm) (e.g. Hammers are 90/130 nm SOI, TBred B is 130 nm, Palomino is 180 nm), the supply voltage, transistor channel length and threshold voltage will be lowered accordingly. Even the supply voltage is lower, the transistors run faster, both current and power density also increase (actual trend). As the transistors are scaled down, logic gate delay decreases, both the active power density (W/cm^2) and the passive leakage power density (from both gate and subthreshold leakage) increase.
The passive leakage current component increases at an even faster pace than the active current, posing problems on cooling and power dissipation for future generations of chips. If this trend continues, the high passive, standby leakage current will lead to high power drawn and high idle CPU temperature, compared to today's CPU, even when the system is idle and the CPU is not under heavy load.
For more details about the low voltage Tbred B 1700+, refer to
Why the 1700+ can run so fast at low Vcore?
What is channel length of a MOS transistor (page 14)